Spectromètre à émission optique sous vide ARL 3460.

• Resolution: 0.4 eV
• CCD detector 1340 x 100
• Greater than 200 spectra/second
• Large pixels, 200 µm x 200 µm, with optical HCR
• Very useful for analysis of light elements such as boron and lithium.

• XPS equipment permits surface chemical analysis of materials  such as metal alloys, carbon-based electrodes, semiconductors, and tissues.

• Model TSI-3936NL86
• Permits concentration measurement of nanoparticles as a function of the electrical-mobility diameter and the particle aerodynamic diameter.

• This device serves to identify and assay solute concentrations that are not detectable by optical absorption due to excessive solvent absorption.
• The specific IR frequencies of vibrations of these molecules (carbonates, oxalates, etc.) modulate the laser frequencies in the visible spectrum and become detectable in the transparency domain of the solutions.

• This device, manufactured by Thermo Electron, is used to analyze the output of a thermobalance to identify the major classes of hydrocarbons (aliphatic, aromatic, heterocyclic, etc.).
• Accessories include a gas chamber for manual injection and a computer.

• This equipment is used to quantitatively identify the presence of metals in the form of oxides.

• Bruker D8 Discover
• X-ray diffraction (XRD) is an essential tool for materials research. It can produce information to indentify phases, crystal structure, residual stresses, and crystallographic orientation (texture).