Resolution: 0.4 eV CCD detector 1340 x 100 Greater than 200 spectra/second Large pixels, 200…
admin14 April, 2015
XPS equipment permits surface chemical analysis of materials such as metal alloys, carbon-based electrodes, semiconductors,…
admin10 April, 2015
Model TSI-3936NL86 Permits concentration measurement of nanoparticles as a function of the electrical-mobility diameter and…
admin10 April, 2015
This device serves to identify and assay solute concentrations that are not detectable by optical…
admin10 April, 2015
This device, manufactured by Thermo Electron, is used to analyze the output of a thermobalance…
admin10 April, 2015
This equipment is used to quantitatively identify the presence of metals in the form of…
admin10 April, 2015
Bruker D8 Discover X-ray diffraction (XRD) is an essential tool for materials research. It can…
admin9 April, 2015
