Spécialité d’équipement Spectroscopy
Spectromètre à émission optique sous vide ARL 3460.
- Resolution: 0.4 eV
- CCD detector 1340 x 100
- Greater than 200 spectra/second
- Large pixels, 200 µm x 200 µm, with optical HCR
- Very useful for analysis of light elements such as boron and lithium.
- XPS equipment permits surface chemical analysis of materials such as metal alloys, carbon-based electrodes, semiconductors, and tissues.
- Model TSI-3936NL86
- Permits concentration measurement of nanoparticles as a function of the electrical-mobility diameter and the particle aerodynamic diameter.
- This device serves to identify and assay solute concentrations that are not detectable by optical absorption due to excessive solvent absorption.
- The specific IR frequencies of vibrations of these molecules (carbonates, oxalates, etc.) modulate the laser frequencies in the visible spectrum and become detectable in the transparency domain of the solutions.
- This device, manufactured by Thermo Electron, is used to analyze the output of a thermobalance to identify the major classes of hydrocarbons (aliphatic, aromatic, heterocyclic, etc.).
- Accessories include a gas chamber for manual injection and a computer.
- This equipment is used to quantitatively identify the presence of metals in the form of oxides.
- Bruker D8 Discover
- X-ray diffraction (XRD) is an essential tool for materials research. It can produce information to indentify phases, crystal structure, residual stresses, and crystallographic orientation (texture).