Catégorie d’équipement Physical and chemical analysis
Rigaku ZSX Primus is a wavelength propagated X-ray fluorescence spectrometer (WDXRF). It makes a semi-quantitative and / or quantitative (standard) determination of minor and major atomic elements, from boron (B) to uranium (U), in a wide variety of sample types (pellets, solids).
Spectromètre à émission optique sous vide ARL 3460.
- Carbolite TZF (1500 °C) and Carbolite ONE TVS (1200 °C) thermobalance measuring mass loss as a function of time and temperature.
- It permits the recupration of volatile evolved H2 and CH4, and the determination of the quantity of tar in carbon-based materials.
- Resolution: 0.4 eV
- CCD detector 1340 x 100
- Greater than 200 spectra/second
- Large pixels, 200 µm x 200 µm, with optical HCR
- Very useful for analysis of light elements such as boron and lithium.
- Instrument for determining the content of carbon, hydrogen, nitrogen, sulphur, and oxygen in organic and other materials.
- This apparatus serves to measure the light absorption in aqueous solutions for the spectral domain where the specific absorption of solvents vary between 200 – 1700 nm.
- This permits quantification of a certain number of solutes which exhibit a specific absorption in this domain, or which modify the absorption bands of water due to O-H bonding.
- XPS equipment permits surface chemical analysis of materials such as metal alloys, carbon-based electrodes, semiconductors, and tissues.
- Model TSI-3936NL86
- Permits concentration measurement of nanoparticles as a function of the electrical-mobility diameter and the particle aerodynamic diameter.
- This device serves to identify and assay solute concentrations that are not detectable by optical absorption due to excessive solvent absorption.
- The specific IR frequencies of vibrations of these molecules (carbonates, oxalates, etc.) modulate the laser frequencies in the visible spectrum and become detectable in the transparency domain of the solutions.